PROJECT TITLE :

Generic Electrostatic Discharges Protection Solutions for RF and Millimeter-Wave Applications

ABSTRACT:

The vertical shrinkage of the advanced CMOS processes thicknesses makes electrostatic discharge (ESD) problems become additional significant. RF and millimeter-wave (mm-wave) circuits are terribly sensitive to the ESD elements’ capacitive parasitic impact. Surface area could be a key issue as well in an ESD protection circuit for mm-wave applications. This paper presents silicon-verified ESD solutions, which fulfill physical dimensions, ESD robustness, and broadband frequencies needs.