JA Purity IV
  • HOME
    • Business
    • Corporate
    • Logistics
    • Product
    • News / Magazine
  • MTECH PROJECTS
    • COMPUTER SCIENCE
      • MTech Python Projects
        • Machine Learning Projects
        • Deep Learning Projects
        • Blockchain Projects
        • django Projects
      • MTech Java Projects
        • Cloud Computing Projects
        • Data Mining Projects
        • Mobile Computing Projects
        • Networking Projects
      • MTech NS2 Projects
        • Wireless Communication Projects
        • Vehicular Technology Projects
      • MTech Hadoop Projects
      • MTech Android Projects
    • ELECTRONICS
      • MTech DSP Projects
      • MTech DIP Projects
      • MTech VLSI Projects
      • MTech Communication Projects
    • ELECTRICAL
      • MTech Power Systems Projects
      • MTech Power Electronics Projects
      • MTech Control Systems Projects
    • OTHER
      • Chemical Projects
      • Mechanical Projects
      • All Other Projects
  • EMBEDDED KITS
    • MTech Embedded Kits
    • BTech Embedded Kits
  • PROJECTS+
  • PUBLISHING
    • Research Publishing
    • Authors Guidelines
    • Publishing Policy
  • CONTACT US

Contact Us

  • 4517 Washington Ave. Manchester, Kentucky 39495
  • (201) 555-0124
  • hello@purityiv.com

Welcome to MTech Projects - Online Projects for MTech Students

  • My Account
  • Careers
  • Downloads
  • Blog
JA Purity IV
  • Email Us
  • Phone Number
  • Open Hours
  • HOME
    • Business
    • Corporate
    • Logistics
    • Product
    • News / Magazine
  • MTECH PROJECTS

    MTech Python Projects

    • Machine Learning Projects
    • Deep Learning Projects
    • Blockchain Projects
    • django Projects

    MTECH JAVA PROJECTS

    • Cloud Computing Projects
    • Data Mining Projects
    • Mobile Computing Projects
    • Networking Projects

    MTECH NS2 PROJECTS

    • Wireless Communication Projects
    • Vehicular Technology Projects
    • MTech Hadoop Projects
    • MTech Android Projects

    ELECTRONICS

    • MTech DSP Projects
    • MTech DIP Projects
    • MTech VLSI Projects
    • MTech Communication Projects

    ELECTRICAL

    • MTech Power Systems Projects
    • MTech Power Electronics Projects
    • MTech Control Systems Projects

    OTHER

    • Chemical Projects
    • Mechanical Projects
    • All Other Projects
  • EMBEDDED KITS
    • MTech Embedded Kits
    • BTech Embedded Kits
  • PROJECTS+
  • PUBLISHING
    • Research Publishing
    • Authors Guidelines
    • Publishing Policy
  • CONTACT US

Project Enquiry

  1. You are here:  
  2. Home
  3. MTech VLSI Projects
  4. Understanding the Relation Between the Performance and Reliability of NAND Flash/SCM Hybrid Solid-State Drive - 2016
Details
Category: MTech VLSI Projects
By MTech Projects
MTech Projects
01.Jun
Hits: 1

Understanding the Relation Between the Performance and Reliability of NAND Flash/SCM Hybrid Solid-State Drive - 2016

PROJECT TITLE :

Understanding the Relation Between the Performance and Reliability of NAND Flash/SCM Hybrid Solid-State Drive - 2016

ABSTRACT:

A NAND flash memory/storage-class memory (SCM) hybrid solid-state drive (SSD) will achieve higher performance than the standard NAND flash-solely SSD. Error-correcting codes (ECCs) are applied to the SSD to correct bit errors occurring within the NAND flash and SCM. To correct additional bit errors, the stronger ECC is required and the ECC latency will increase. This paper evaluates the relation between the performance and also the reliability of the NAND flash/SCM hybrid SSD. 1st, how the ECC latency impacts the SSD performance is analyzed. Then, the SSD performances are evaluated with various knowledge-access patterns. The ECC effect is considerably completely different among the information-access patterns. Moreover, four situations of the SCM reliability are established and the performances are evaluated with the four data-access patterns. When the SCM reliability becomes high, the decrease in the throughput due to the ECC for SCM becomes significantly small. Finally, by setting the suitable SSD performance, the acceptable bit-error rate (BER) of the SCM is evaluated. The SCM BER can be as high as around 0.9p.c.

Did you like this research project?

To get this research project Guidelines, Training and Code... Click Here

  • ROOT
  • Storage-Class Memory (SCM)
  • Error-Correcting Code (ECC)
  • Solid-State Drive (SSD)
  • ROOT
  • Storage-Class Memory (SCM)
  • Error-Correcting Code (ECC)
  • Solid-State Drive (SSD)
Previous article: Low-Power/Cost RNS Comparison via Partitioning the Dynamic Range - 2016 Low-Power/Cost RNS Comparison via Partitioning the Dynamic Range - 2016 Next article: Optimized Built-In Self-Repair for Multiple Memories - 2016 Optimized Built-In Self-Repair for Multiple Memories - 2016
COMPUTER SCIENCE PROJECTS ELECTRONICS PROJECTS MTech DSP Projects MTech DIP Projects MTech VLSI Projects MTech VHDL Projects MTech Verilog Projects MTech Communication Projects ELECTRICAL PROJECTS EMBEDDED PROJECTS MECHANICAL PROJECTS

sell academic m.tech, btech and be projects online

sell academic m.tech, btech and be projects online

Academic Final Year Projects

QUICK LINKS

  • Python Projects
  • Java Projects
  • Android Projects
  • Digital Signal Processing
  • Image Processing Projects
  • VLSI Projects
  • Power Systems
  • Power Electronics
SUPPORT
+91 9573777164
9:00am - 6:00pm IST
info@mtechprojects.com

Navigate

  • ABOUT
  • TESTIMONIALS
  • FIND A DEALER
  • CAREERS

CONTACT

  • CONTACT
  • FAQ
  • RESOURCES
  • EMAIL US

Useful links

  • REFUND & RETURN POLICY
  • PRIVACY POLICIES

Support

  • FACEBOOK
  • TWITTER
  • PINTEREST
  • GOOGLE PLUS
Copyright © 2026 MTech Projects. All Rights Reserved.