JA Purity IV
  • HOME
    • Business
    • Corporate
    • Logistics
    • Product
    • News / Magazine
  • MTECH PROJECTS
    • COMPUTER SCIENCE
      • MTech Python Projects
        • Machine Learning Projects
        • Deep Learning Projects
        • Blockchain Projects
        • django Projects
      • MTech Java Projects
        • Cloud Computing Projects
        • Data Mining Projects
        • Mobile Computing Projects
        • Networking Projects
      • MTech NS2 Projects
        • Wireless Communication Projects
        • Vehicular Technology Projects
      • MTech Hadoop Projects
      • MTech Android Projects
    • ELECTRONICS
      • MTech DSP Projects
      • MTech DIP Projects
      • MTech VLSI Projects
      • MTech Communication Projects
    • ELECTRICAL
      • MTech Power Systems Projects
      • MTech Power Electronics Projects
      • MTech Control Systems Projects
    • OTHER
      • Chemical Projects
      • Mechanical Projects
      • All Other Projects
  • EMBEDDED KITS
    • MTech Embedded Kits
    • BTech Embedded Kits
  • PROJECTS+
  • PUBLISHING
    • Research Publishing
    • Authors Guidelines
    • Publishing Policy
  • CONTACT US

Contact Us

  • 4517 Washington Ave. Manchester, Kentucky 39495
  • (201) 555-0124
  • hello@purityiv.com

Welcome to MTech Projects - Online Projects for MTech Students

  • My Account
  • Careers
  • Downloads
  • Blog
JA Purity IV
  • Email Us
  • Phone Number
  • Open Hours
  • HOME
    • Business
    • Corporate
    • Logistics
    • Product
    • News / Magazine
  • MTECH PROJECTS

    MTech Python Projects

    • Machine Learning Projects
    • Deep Learning Projects
    • Blockchain Projects
    • django Projects

    MTECH JAVA PROJECTS

    • Cloud Computing Projects
    • Data Mining Projects
    • Mobile Computing Projects
    • Networking Projects

    MTECH NS2 PROJECTS

    • Wireless Communication Projects
    • Vehicular Technology Projects
    • MTech Hadoop Projects
    • MTech Android Projects

    ELECTRONICS

    • MTech DSP Projects
    • MTech DIP Projects
    • MTech VLSI Projects
    • MTech Communication Projects

    ELECTRICAL

    • MTech Power Systems Projects
    • MTech Power Electronics Projects
    • MTech Control Systems Projects

    OTHER

    • Chemical Projects
    • Mechanical Projects
    • All Other Projects
  • EMBEDDED KITS
    • MTech Embedded Kits
    • BTech Embedded Kits
  • PROJECTS+
  • PUBLISHING
    • Research Publishing
    • Authors Guidelines
    • Publishing Policy
  • CONTACT US

Project Enquiry

  1. You are here:  
  2. Home
  3. MTech DIP Projects
  4. For JND-Noise-Contaminated Images, a Perceptual Distinguishability Predictor
Details
Category: MTech DIP Projects
By MTech Projects
MTech Projects
24.Nov
Hits: 1

For JND-Noise-Contaminated Images, a Perceptual Distinguishability Predictor

PROJECT TITLE :

A Perceptual Distinguishability Predictor For JND-Noise-Contaminated Images

ABSTRACT:

These models are commonly used to estimate perceptual redundancy in images and videos. You can use a typical JND model evaluation method to test the model's accuracy by using a random noise generator to insert random noise into an image generated by the JND model. At the same time, comparing two distinct JND models, it is preferable to use one that provides an image with greater quality at the same amount of noise energy than the other model. It's time-consuming and expensive to conduct a subjective test in any instance. Full-reference metric termed PDP (perceptual distinguishability predictor) can be used to evaluate whether a particular JND-noise-contaminated image is perceptually discernible from the reference image. For example, the suggested metric leverages the sparse coding idea and extracts an image pair feature vector. After that, a multilayer neural network is used to classify the feature vector. An comprehensive subjective experiment yielded four distinct JND models, which we used to build a public library of photos with distinguishability thresholds. According to the findings, PDD has a classification accuracy rate of 97.1%. An objective comparison of several JND models can be made using the proposed method. It can also be used to improve the JND thresholds estimated by an arbitrary JND model by using correct scaling factors.

Did you like this research project?

To get this research project Guidelines, Training and Code... Click Here

Previous article: A New Approach to Edge Detection Based on Diffusion A New Approach to Edge Detection Based on Diffusion Next article: With Applications to Face Recognition, A Robust Group-Sparse Representation Variational Method With Applications to Face Recognition, A Robust Group-Sparse Representation Variational Method
COMPUTER SCIENCE PROJECTS ELECTRONICS PROJECTS MTech DSP Projects MTech DIP Projects MTech VLSI Projects MTech VHDL Projects MTech Verilog Projects MTech Communication Projects ELECTRICAL PROJECTS EMBEDDED PROJECTS MECHANICAL PROJECTS

sell academic m.tech, btech and be projects online

sell academic m.tech, btech and be projects online

Academic Final Year Projects

QUICK LINKS

  • Python Projects
  • Java Projects
  • Android Projects
  • Digital Signal Processing
  • Image Processing Projects
  • VLSI Projects
  • Power Systems
  • Power Electronics
SUPPORT
+91 9573777164
9:00am - 6:00pm IST
info@mtechprojects.com

Navigate

  • ABOUT
  • TESTIMONIALS
  • FIND A DEALER
  • CAREERS

CONTACT

  • CONTACT
  • FAQ
  • RESOURCES
  • EMAIL US

Useful links

  • REFUND & RETURN POLICY
  • PRIVACY POLICIES

Support

  • FACEBOOK
  • TWITTER
  • PINTEREST
  • GOOGLE PLUS
Copyright © 2026 MTech Projects. All Rights Reserved.