PROJECT TITLE :

In Situ ESD Protection Structure for Variable Operating Voltage Interface Applications in 28-nm CMOS Process

ABSTRACT:

A multiple-discharge-path electrostatic discharge (ESD) cell for protecting input/output (IO) pins with a variable operating voltage (0.5-3.5 V) is presented. This device is optimized for low capacitance and synthesized with the circuit IO components for in situ ESD protection in communication interface applications developed in the 28-nm high-k metal-gate CMOS technology.